We study the structural properties, such as size, shape and composition, of semiconductor nanostructures and relate them to the opto-electronic and magnetic properties of individual nanostructures. We have a unique expertise in cross-sectional STM which allows accessing the atomic scale properties of nanostructures such as quantum dots and quantum rings. We use other scanning probe techniques and confocal microscopy to explore the optical and magnetic properties of individual nanostructures. The XSTM technique allows us also to study single and interacting magnetic impurities in a semiconductor material or even an individual nanostructure.
Meer weten?
Wil je meer informatie over de inhoud van het dossier of in contact worden gebracht met de kennisaanbieder? Neem dan contact met ons op.