Reliability is the probability that a product in operation will survive under certain conditions during a certain period in time, starting from 0 hour. Failure is the probability that a product is not functioning as designed.
Due to the rapid technology development combined with shorter time-to-market, for many micro/nanoelectronic products (such as advanced IC, SiP, sensors, actuators, etc), their reliability is poorly understood. Product field failure rates and qualification effort are unacceptably high, with lower yield, leading to very high cost of non-quality. Industries are losing billions in potential profits due to the field failures and delays in product release. This is partially due to the unsolved challenges covering design methods, reliability practices, tools, standardization protocols, and above all many underlying fundamental knowledge.
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